NCPRE’s Prof. Narendra Shiradkar attended the NREL PV Reliability Workshop (PVRW) in Golden, Colorado, USA in late March 2025. In the workshop, which is the leading gathering of the international PV reliability community, he presented the latest findings from NCPRE’s work on bypass diode reliability, titled “A New Vulnerability in Bypass Diodes Under High Temperature, Long Term Operation in Reverse Bias (HTRB)”. This work attracted the attention of several experts engaged in the field reliability assessment of PV modules as well as those from the international IEC TC82 / WG2 Working Group. Several individuals from leading PV industry houses showed interest to establish similar testing facilities for bypass diodes. Prof. Shiradkar also shared feedback with the international community from the recent field surveys and research initiatives by NCPRE specifically related to glass cracking in Glass-Glass modules in India. The details of the full research paper are: Karan P Rane, Narendra Shiradkar, “Long term durability assessment of Schottky bypass diodes in photovoltaic modules under high temperature reverse bias operation”, Solar Energy, Volume 286, pp. 113152, January 2025.